| 000 | 00871nam a2200229 a 4500 | ||
|---|---|---|---|
| 001 | vtls000046000 | ||
| 003 | UG-KaMUL | ||
| 005 | 20250608172057.0 | ||
| 008 | 050322 1983 gw 000 0 eng d | ||
| 039 |
_a201402191538 _b964 _c200603030824 _d901 _c200603030824 _d901 _c200504151533 _d908 _y200503221827 _z911 |
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| 040 | _aUG-KaMUL | ||
| 082 | _a547.3533 INT | ||
| 111 | 2 | _aInternational Conference on Secondary Ion Mass Spectrometry (SIMS-IV ) 4th (1983: Osaka, Japan) | |
| 245 | 1 |
_aSecondary ion mass spectrometry (SISM IV): _bproceedings of the fou rth International Conference / _cedited by A. Benning-hoven |
|
| 260 |
_aBerlin : _bSpringer-Varlag , _c1983 |
||
| 300 |
_axv, 503 p. : _bill. ; _c24 cm |
||
| 650 | _aSecondary ion mass spectrometry | ||
| 700 | 1 | _aBenninghoven, A. | |
| 942 |
_2ddc _cBK |
||
| 999 |
_c35645 _d35645 |
||