| 000 | 01012nam a2200265 a 4500 | ||
|---|---|---|---|
| 001 | vtls000126872 | ||
| 003 | UG-KaMUL | ||
| 005 | 20250617204848.0 | ||
| 020 | _a0306440032 | ||
| 039 | 9 |
_a 200601311156 _b 900 _c 200510141246 _d 964 _y 200510141245 _z 964 |
|
| 040 | _aUG-KaMUL | ||
| 060 | 0 |
_a W 3 _b Ad95 1991 |
|
| 245 | 0 |
_aAdvances in x-ray analysis / _cedited by Charles S. Barrett...[et a l]; sponsored by University of Denver Depatrment of Engineering and JCP DS (July 30-Aug. 3 1990) _b |
|
| 260 |
_aNew York : _bPlenum Press , _c1991. |
||
| 300 |
_a v. : _b ill. ; _c 26 cm. |
||
| 440 |
_aInternational Centre for Diffraction Data; _vvol. 34 |
||
| 504 | _a Includes bibliographical references and index. | ||
| 650 | 2 |
_aChemistry, Analytical _vCongresses _x _y _z |
|
| 650 | 2 |
_aRadiography _vCongresses _x _y _z |
|
| 700 | 1 | _aBarrett, Charles S. | |
| 710 | 2 |
_aUniversity of Denver Department of Engineering _b |
|
| 942 |
_2ddc _cBK |
||
| 999 |
_c163779 _d163779 |
||