UNIVERSITY LIBRARY CATALOGUE

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Transmission electron microscopy of silicon VLSI circuits and struct ures / R.B. Marcus and T.T. Sheng. by
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: New York : Wiley, c1983
Availability: Items available for loan: Main Library - Open Shelves (1).

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Transmission electron microscopy and diffractometry of materials / Brent Fultz, James Howe. by
Material type: Text Text
Publication details: Berlin ; New York : Springer, 2001
Availability: Items available for loan: College of Natural Sciences Library- CONAS (1)Call number: 620.11299 FUL.