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1.	Image from Amazon.com	Applied survival analysis : regression modeling of time to event data / David W. Hosmer, Jr., Stanley Lemeshow. by Hosmer, David W Lemeshow, Stanley Series: Wiley series in probability and statistics. Texts and reference s ection Material type: Text; Format: print ; Literary form: Not fiction Publication details: New York : Wiley, c1999 Availability: Items available for loan: Main Library - IDA Extension (2)Call number: 610.727 HO S, ... Place hold Save to lists Add to cart (remove)
2.	Image from Amazon.com	Applied logistic regression / David W. Hosmer, Jr., Stanley Lemes how. by Hosmer, David W Lemeshow, Stanley Series: Wiley series in probability and mathematical statistics. Applied probability and statistics. ; Material type: Text Publication details: New York : Wiley, c1989 Availability: Items available for loan: Faculty of Veterinary Medicine - Book Bank (7)Call number: 519.536 HOS, ... Institute of Statistics and Applied Economics Book Bank (1)Call number: 519.536 HOS. Place hold Save to lists Add to cart (remove)
3.	Image from Amazon.com	Applied logistics regression / David W. Hosmer, Stanley Lemeshow. by Hosmer, David W Lemeshow, Stanley Series: Wiley series in probability and statistics Edition: 2nd ed. Material type: Text Publication details: New York : John Wiley & Sons, 2000 Availability: Items available for loan: Institute of Statistics and Applied Economics Book Bank (4)Call number: 519.536 HOS, ... Main Library - IDA (3)Call number: 519.536 HOS, ... Place hold Save to lists Add to cart (remove)
4.	Image from Amazon.com	Applied logistics regression / David W. Hosmer, Stanley Lemeshow. by Hosmer, David W Lemeshow, Stanley Series: Wiley series in probability and statistics Edition: 2nd ed. Material type: Text Publication details: New York : John Wiley & Sons, 2000 Availability: No items available. Save to lists Add to cart (remove)
5.	Image from Amazon.com	Applied logistics regression / David W. Hosmer, Stanley Lemeshow. by Hosmer, David W Lemeshow, Stanley Series: Wiley series in probability and statistics Edition: 2nd ed. Material type: Text Publication details: New York : John Wiley & Sons, 2000 Availability: No items available. Save to lists Add to cart (remove)