UNIVERSITY LIBRARY CATALOGUE

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1.
A formal investigation of the reliability of semiconductor devices / by Moses B. Murengezi. by
Material type: Text Text
Publication details: Kampala : Makerere University, 1980
Dissertation note: Dissertation (BSc. Electr. Eng.) - Makerere University, 1980.
Availability: Items available for loan: Faculty of Technology - Book Bank (1)Call number: 621.38152 MUR.

2.
A formal investigation of the reliability of semiconductor devices / by Moses B. Murengezi. by
Material type: Text Text
Publication details: Kampala : Makerere University, 1980
Dissertation note: Dissertation (BSc. Electr. Eng.) - Makerere University, 1980.
Availability: No items available.

3.
A formal investigation of the reliability of semiconductor devices / by Moses B. Murengezi. by
Material type: Text Text
Publication details: Kampala : Makerere University, 1980
Dissertation note: Dissertation (BSc. Electr. Eng.) - Makerere University, 1980.
Availability: No items available.