Atomic force microscopy, scanning nearfield optical microscopy and n anoscratching : application to rough and natural surfaces / G. Ka upp.

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Material type: Text

TextSeries: Nanoscience and technologyPublication details: Berlin ; New York : Springer-Verlag, c2006.Description: xii, 292 p. : ill. ; 24 cmISBN:

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Item type	Current library	Status	Barcode
Books - Open Access	College of Natural Sciences Library- CONAS	Available	001358420

Includes bibliographical references and index.

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