TY  - BOOK
AU  -  Kaupp, G.
TI  -  Atomic force microscopy, scanning nearfield optical microscopy and n anoscratching: application to rough and natural surfaces 
SN  -  9783540284055
U1  -  502.82 KAU 
PY  - 2006///
CY  -  Berlin,  New York
PB  -  Springer-Verlag
KW  -  Atomic force microscopy
N1  -  Includes bibliographical references and index
ER  -