Applied econometrics : a modern approach using EViews and Microfi t /
Dimitrios Asteriou and Stephen G. Hall.
- Rev. ed.
- New York, N.Y. : Palgrave Macmillan, 2007.
- xxv, 407 p. : ill. ; 25 cm.
Includes bibliographical references and index.
Statistical background and basic data handling -- The classical li near regression model -- Violating the assumptions of the CLRM -- T opics in econometrics -- Time series econometrics -- Panel data eco nometrics.