TY  - BOOK
AU  - Schroder, Dieter K.
TI  -  Semiconductor material and device characterization
SN  - 0471739065 (acidfree paper)
U1  - 621.3815/2  22
PY  - 2006///
CY  - [Piscataway, NJ]
PB  - IEEE Press
KW  - Semiconductors
KW  -  Testing
N1  - "Wiley-Interscience."; Includes bibliographical references and index
ER  -