TY  - BOOK
AU  - Murengezi, Moses B.
TI  -  A formal investigation of the reliability of semiconductor devices
U1  - 621.38152 
PY  - 1980///
CY  - Kampala
PB  - Makerere University
KW  - Semiconductors
N1  - Dissertation (BSc. Electr. Eng.) - Makerere University, 1980; Includes bibliographical references
ER  -