Murengezi, Moses B. <br/><br/>
A formal investigation of the reliability of semiconductor devices / 
by Moses B. Murengezi. 
 - Kampala :  Makerere University,  1980. 
 - viii, 116 p. ;  27 cm. 
<br/><br/>Dissertation (BSc. Electr. Eng.) - Makerere University, 1980. 
<br/><br/>Includes bibliographical references. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors.
<br/><br/><label>Dewey Class. No.: </label>621.38152