Journey to data quality / 
Yang W. Lee ... [et al]. 
 - Cambridge :  The MIT Press,  2006. 
 - xii, 226 p. ;  24 cm. 
<br/><br/>Includes bibliographies. 
<br/><br/><label>ISBN: </label>10:0262122871 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Business-- Data processing-- Management.<br/>Database management-- Quality control.