Fultz, B.  <br/><br/>
Transmission electron microscopy and diffractometry of materials /  
Brent Fultz, James Howe. 
 - Berlin ;    New York :    Springer,    2001. 
 - xix, 748 p. :    ill. ;    24 cm. 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>3540678417 (alk. paper) 
<br/><br/><label>LCCN: </label>00-049275 
<br/><br/><label>Subjects--Topical Terms: </label><br/> Materials -- Microscopy.<br/> Transmission electron microscopy.<br/> X-ray diffractometer.
<br/><br/><label>Dewey Class. No.: </label>620.11299