Pietsch, Ullrich,    1952- <br/><br/>
High-resolution X-ray scattering :   from thin films to lateral nan ostructures /  
Ullrich Pietsch, Vaclav Holy, Tilo Baumbach. 
 - 2nd ed. 
 - New York :   Springer,   c2004. 
 - xvi, 408 p. :    ill. ;    25 cm. 
<br/><br/>Includes bibliographical references (p. [389]-402) and index. 
<br/><br/><label>ISBN: </label>0387400923 (alk. paper) 
<br/><br/><label>LCCN: </label>2003-070360 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Thin films --Optical properties.------<br/>X-rays --Scattering.------<br/>X-rays --Diffraction.------<br/>Nanostructured materials.--------
<br/><br/><label>Dewey Class. No.: </label>530.4/175