Journey to data quality / Yang W. Lee ... [et al].
Material type:
TextPublication details: Cambridge : The MIT Press, 2006.Description: xii, 226 p. ; 24 cmISBN: - 10:0262122871
| Item type | Current library | Status | Barcode | |
|---|---|---|---|---|
Books - Open Access
|
EASLIS Library - Closed Access | Available | 001260764 |
Includes bibliographies.
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