Modern developments in electron microscopy / Benjamin M. Siegel.
Material type:
TextPublication details: New York : Academic Press, 1964.Description: xii, 432 p. ; 24 cmSubject(s): DDC classification: - 578.45 SIE
| Item type | Current library | Status | Barcode | |
|---|---|---|---|---|
Books - Open Access
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Main Library - Open Shelves | Available | 173717 | |
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Books - Open Access
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Main Library - Open Shelves | Available | 173718 |
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