UNIVERSITY LIBRARY CATALOGUE

Residual stress : measurement by diffraction and interpretation / Ismail C. Noyan and Jerome B. Cohen.

By: Contributor(s): Material type: TextTextSeries: Materials research and engineeringPublication details: New York : Springer, 1987.Description: x, 276 p. : ill. ; 25 cmSubject(s):
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Books - Open Access Books - Open Access Main Library - IDA Available 001008912

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