UNIVERSITY LIBRARY CATALOGUE

Modern developments in electron microscopy / Benjamin M. Siegel.

By: Material type: TextTextPublication details: New York : Academic Press , 1964.Description: xiii, 432 p. : ill., diagrs. ; 24 cmSubject(s): NLM classification:
  • QH 205
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
Holdings
Item type Current library Call number Status Barcode
Books - Open Access Books - Open Access ACM Library - Open stacks QH 205 Si15m (Browse shelf(Opens below)) Available ACM 23048

Includes bibliographical references.

There are no comments on this title.

to post a comment.
Share