UNIVERSITY LIBRARY CATALOGUE

Semiconductor measurements and instrumentation / (Record no. 267697)

MARC details
000 -LEADER
fixed length control field 00702pam a22002411i 4500
001 - CONTROL NUMBER
control field vtls000243716
003 - CONTROL NUMBER IDENTIFIER
control field UG-KaMUL
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20250609142049.0
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 0070542732
039 9# - LEVEL OF BIBLIOGRAPHIC CONTROL AND CODING DETAIL [OBSOLETE]
-- 200806191712
-- 909
040 ## - CATALOGING SOURCE
Original cataloging agency UG-KaMUL
082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 537.622
092 ## - LOCALLY ASSIGNED DEWEY CALL NUMBER (OCLC)
Classification number 537.622 RUN
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Runyan, W.R.
245 10 - TITLE STATEMENT
Title Semiconductor measurements and instrumentation /
Statement of responsibility, etc. W.R. Runyan.
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. New York :
Name of publisher, distributor, etc. McGraw-Hill,
Date of publication, distribution, etc. 1975.
300 ## - PHYSICAL DESCRIPTION
Extent vii, 280 p. :
Other physical details ill. ;
Dimensions 26 cm.
490 0# - SERIES STATEMENT
Series statement Texas Instruments electronics series
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc. note Includes bibliographical references and index.
650 0# - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Semiconductors.
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme Dewey Decimal Classification
Koha item type Books - Open Access

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