X-ray microscopy : proceedings of the international symposium, G èottingen, Fed. Rep. of Germany, September 14-16, 1983 / editors, G. Schmahl and D. Rudolph.
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TextSeries: Springer series in optical sciences ; v. 43Publication details: Berlin ; New York : Springer-Verlag, 1984.Description: ix, 345 p. : ill. (some col.) ; 24 cmSubject(s): DDC classification: - 502.82 XRA
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