Advances in x-ray analysis / edited by Charles S. Barrett...[et a l]; sponsored by University of Denver Depatrment of Engineering and JCP DS (July 30-Aug. 3 1990)

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Material type: Text

TextSeries: International Centre for Diffraction Data ; vol. 34Publication details: New York : Plenum Press , 1991.Description: v. : ill. ; 26 cmISBN:

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Holdings
Item type	Current library	Call number	Status	Barcode
Books - Open Access	ACM Library - Open stacks	W 3 Ad95 1991 (Browse shelf(Opens below))	Available	ACM 25366

Includes bibliographical references and index.

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